Siemens Digital Industries Software has introduced software for identifying defects in microcircuits with a manufacturing process of 5 nm or larger, Siemens’ press service reported on July 9.
Tessent Hi-Res Chain software allows you to determine the most likely failure points of microcircuits based on test cycle data. Microcircuits are analyzed from the point of view of possible physical and logical defects.
The software’s operation is based on a comparison of test results and microcircuit design data. According to the developer, each new cycle of failed tests provides data to clarify possible failure points. It is claimed that up to 80% of software defect assumptions are confirmed by functional analysis.
The solution can significantly reduce the debugging time of the microcircuit and increase its reliability and performance. The software works with nodes and microcircuits designed for technological standards of 5 nm and higher.
Source: Rossa Primavera
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